SHREC'25 track: Retrieval and Segmentation of Multiple Relief Patterns

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dc.contributor.authorPaolini, Gabrieleen_US
dc.contributor.authorTortorici, Claudioen_US
dc.contributor.authorBerretti, Stefanoen_US
dc.contributor.editorGuerrero, Paulen_US
dc.contributor.editorPratikakis, Ioannisen_US
dc.contributor.editorVeltkamp, Remcoen_US
dc.date.accessioned2025-08-29T08:12:30Z
dc.date.available2025-08-29T08:12:30Z
dc.date.issued2025
dc.description.abstractThis SHREC 2025 track focuses on the recognition and segmentation of relief patterns embedded on the surface of a novel set of synthetically generated triangle meshes. Although the track garnered considerable interest, the problem remains open at the end of the track. In this report, we introduce a new 3D benchmark which was published to assess the performance of the most recent relief pattern recognition algorithms. We discuss the limitations of current techniques; the intrinsic challenges to face to address relief pattern analysis, and potential future research directions in this field.en_US
dc.description.sectionheadersShort Papers
dc.description.seriesinformationEurographics Workshop on 3D Object Retrieval
dc.identifier.doi10.2312/3dor.20251202
dc.identifier.isbn978-3-03868-280-6
dc.identifier.issn1997-0471
dc.identifier.pages8 pages
dc.identifier.urihttps://doi.org/10.2312/3dor.20251202
dc.identifier.urihttps://diglib.eg.org/handle/10.2312/3dor20251202
dc.publisherThe Eurographics Associationen_US
dc.rightsAttribution 4.0 International License
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subjectCCS Concepts: Computing methodologies → Shape analysis; Computer vision problems; Interest point and salient region detections; Information systems → Content analysis and feature selection
dc.subjectComputing methodologies → Shape analysis
dc.subjectComputer vision problems
dc.subjectInterest point and salient region detections
dc.subjectInformation systems → Content analysis and feature selection
dc.titleSHREC'25 track: Retrieval and Segmentation of Multiple Relief Patternsen_US
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