Browsing by Author "Lehtinen, Jaakko"
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Item Appearance-Driven Automatic 3D Model Simplification(The Eurographics Association, 2021) Hasselgren, Jon; Munkberg, Jacob; Lehtinen, Jaakko; Aittala, Miika; Laine, Samuli; Bousseau, Adrien and McGuire, MorganWe present a suite of techniques for jointly optimizing triangle meshes and shading models to match the appearance of reference scenes. This capability has a number of uses, including appearance-preserving simplification of extremely complex assets, conversion between rendering systems, and even conversion between geometric scene representations. We follow and extend the classic analysis-by-synthesis family of techniques: enabled by a highly efficient differentiable renderer and modern nonlinear optimization algorithms, our results are driven to minimize the image-space difference to the target scene when rendered in similar viewing and lighting conditions. As the only signals driving the optimization are differences in rendered images, the approach is highly general and versatile: it easily supports many different forward rendering models such as normal mapping, spatially-varying BRDFs, displacement mapping, etc. Supervision through images only is also key to the ability to easily convert between rendering systems and scene representations. We output triangle meshes with textured materials to ensure that the models render efficiently on modern graphics hardware and benefit from, e.g., hardware-accelerated rasterization, ray tracing, and filtered texture lookups. Our system is integrated in a small Python code base, and can be applied at high resolutions and on large models. We describe several use cases, including mesh decimation, level of detail generation, seamless mesh filtering and approximations of aggregate geometry.Item Data-driven Pixel Filter Aware MIP Maps for SVBRDFs(The Eurographics Association, 2023) Kemppinen, Pauli; Aittala, Miika; Lehtinen, Jaakko; Ritschel, Tobias; Weidlich, AndreaWe propose a data-driven approach for generating MIP map pyramids from SVBRDF parameter maps. We learn a latent material representation where linear image downsampling corresponds to linear prefiltering of surface reflectance. In contrast to prior work, we explicitly model the effect of the antialiasing pixel filter also at the finest resolution. This yields high-quality results even in images that are shaded only once per pixel with no further processing. The SVBRDF maps produced by our method can be used as drop-in replacements within existing rendering systems, and the data-driven nature of our framework makes it possible to change the shading model with little effort. As a proof of concept, we also demonstrate using a shared latent representation for two different shading models, allowing for automatic conversionItem Quantifying the Error of Light Transport Algorithms(The Eurographics Association and John Wiley & Sons Ltd., 2019) Celarek, Adam; Jakob, Wenzel; Wimmer, Michael; Lehtinen, Jaakko; Boubekeur, Tamy and Sen, PradeepThis paper proposes a new methodology for measuring the error of unbiased physically based rendering algorithms. The current state of the art includes mean squared error (MSE) based metrics and visual comparisons of equal-time renderings of competing algorithms. Neither is satisfying as MSE does not describe behavior and can exhibit significant variance, and visual comparisons are inherently subjective. Our contribution is two-fold: First, we propose to compute many short renderings instead of a single long run and use the short renderings to estimate MSE expectation and variance as well as per-pixel standard deviation. An algorithm that achieves good results in most runs, but with occasional outliers is essentially unreliable, which we wish to quantify numerically. We use per-pixel standard deviation to identify problematic lighting effects of rendering algorithms. The second contribution is the error spectrum ensemble (ESE), a tool for measuring the distribution of error over frequencies. The ESE serves two purposes: It reveals correlation between pixels and can be used to detect outliers, which offset the amount of error substantially.